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SUMMARY:Advanced Atomic Force Microscopy Techniques and their Applications
  in Low-Dimensional Materials
DTSTART;VALUE=DATE-TIME:20260409T020000Z
DTEND;VALUE=DATE-TIME:20260409T030000Z
DTSTAMP;VALUE=DATE-TIME:20260406T070700Z
UID:indico-event-4891@indico-tdli.sjtu.edu.cn
DESCRIPTION:Speakers: Zhihai Cheng(程志海) (Renmin University of China)
 \n\nHost: Prof. Jinbo Peng  Venue: TDLI Meeting Room N102Tencent Meetin
 g link: https://meeting.tencent.com/dm/4nmG0qRGvofNMeeting ID: 697486206\
 , no password Abstract:Advances in nanoscale characterization and metrolo
 gy have played a foundational role in the development of modern nanoscienc
 e and nanotechnology. Among the major experimental approaches\, electron m
 icroscopy\, scanning probe microscopy\, and super-resolution optical micro
 scopy have played particularly important roles in probing matter at the na
 noscale. In particular\, scanning probe microscopy\, represented by scanni
 ng tunneling microscopy and atomic force microscopy\, has evolved into one
  of the principal platforms for characterizing the structure\, physical pr
 operties\, and functional behavior of materials at micro- and nanometer sc
 ales in both fundamental research and technological applications. Among th
 ese techniques\, atomic force microscopy is the most widely used and can f
 unction not only as a high-resolution imaging tool\, but also as a nanosca
 le “eye” and “hand” when integrated with complementary measurement
  methods.Here\, the fundamental principles and operating modes of atomic f
 orce probe microscopy will first be briefly introduced\, followed by a pre
 sentation of our recent progress in the development and application of adv
 anced AFM-based functional modes\, including multifrequency atomic force m
 icroscopy\, multifrequency electrostatic force microscopy\, torsional shea
 r force microscopy\, scanning microwave microscopy\, and magnetic force mi
 croscopy. Representative examples involving the integration of these techn
 iques with transport measurements in micro- and nanoscale devices will als
 o be discussed\, including interfacial strain structures\, interlayer char
 ge transfer\, topological spin textures and unconventional magnetic struct
 ures. Finally\, an outlook will be provided on the future development of a
 dvanced AFM functional modes and their potential applications. Biography:
 Zhihai Cheng is a Professor and Ph.D. Supervisor in the School of Physics 
 at Renmin University of China. He is a recipient of the National Science F
 und for Excellent Young Scholars and serves as a council member for both t
 he Microscopy Instrumentation Division of the China Instrument and Control
  Society and the Micro/Nano Branch of the Chinese Ceramic Society. He rece
 ived his Ph.D. in condensed matter physics in 2007 from the Laboratory of 
 Nanophysics and Devices\, Institute of Physics\, Chinese Academy of Scienc
 es. From August 2011 to 2017\, he worked at the National Center for Nanosc
 ience and Technology (the CAS Key Laboratory of Standardization and Measur
 ement for Nanotechnology)\, where he served as Associate Professor and lat
 er Professor. He was selected for the CAS Program for Introducing Outstand
 ing Technical Talents and received the first Outstanding Young Scientist A
 ward\, the Lu Jiaxi Young Talent Award\, and the first Interdisciplinary a
 nd Innovation Award from the Youth Innovation Promotion Association of the
  Chinese Academy of Sciences. His current research focuses on the developm
 ent of advanced atomic force probe microscopy and analysis techniques\, as
  well as their fundamental applications in low-dimensional materials\, sur
 face and interface physics\, and atomic-scale manufacturing.\n\nhttps://in
 dico-tdli.sjtu.edu.cn/event/4891/
LOCATION:Tsung-Dao Lee Institute/N1F-N102 - Smart Classroom (Tsung-Dao Lee
  Institute)
URL:https://indico-tdli.sjtu.edu.cn/event/4891/
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