Speaker
Description
The shot-noise scanning tunneling microscopy (SN-STM) is an emerging breakthrough in scanning probe techniques, achieving unprecedented atomic-scale resolution in shot-noise measurements to directly resolve the effective charge of tunneling carriers. This presentation will first introduce the fundamental physics of shot noise and its unique applications in quantum transport characterization, followed by the key technical hurdles in implementing shot-noise detection in STM systems. I will then detail our hardware design and assembly process, and rigorous performance validation demonstrating 1e and 2e effective charge measurements. Finally, I will present a roadmap for next-generation SN-STM optimization, targeting enhanced sensitivity through cryogenic RF circuit redesign.
| Session Selection | Condensed Matter |
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