24–27 May 2024
Tsung-Dao Lee Institute
Asia/Shanghai timezone

Validation of the VUV-reflective coating for next-generation liquid xenon detectors

26 May 2024, 10:00
30m
N4F-N400 (Tsung-Dao Lee Institute)

N4F-N400

Tsung-Dao Lee Institute

NO.520 Shengrong Road, Shanghai, 201210, China

Speaker

Igor Ostrovskiy (University of Alabama)

Description

Coating detector materials with films highly reflective in the vacuum ultraviolet (VUV) region improves sensitivity of the next-generation rare-event detectors that use liquid xenon (LXe). In particular, nEXO requires its Cu field-shaping rings and cathode to be coated by films that are 80% reflective at 175 nm, the mean wavelength of LXe scintillation. Other experiments, like DARWIN, could also benefit from such films. Al-MgF$_2$ coatings are known to be highly reflective in VUV, but depositing Al directly on Cu leads to alloying, decreasing VUV reflectance. Additionally, it was not clear how thin-film coatings would perform on realistic detector components, which are unpolished and passivated. This talk describes dedicated measurements in LXe and gaseous nitrogen of thin-film coatings that were designed to address these issues.

Primary author

Igor Ostrovskiy (University of Alabama)

Presentation materials